Department of Physics and Astronomy UD
Welcome to the Department of Physics & Astronomy at the University of Delaware! Students, staff and faculty of this Department are united in our prime objective: to be recognized nationally and internationally for excellence in physics and astronomy research and education at the graduate and undergraduate level. The research of our award-winning faculty covers the whole breadth of the field and extends into neighboring disciplines. Our home - the Sharp Lab - offers over 70,000 square feet of research space equipped with state-of-the-art facilities and research instrumentation. With annual research expenditures of $7.3 Million, chances are we are working on something of interest to you.
Regards,
George C. Hadjipanayis
Professor and Dept. Chair
Inquiries regarding instrumentation usage and availability should be emailed to R. Schmidt.
Website: http://web.physics.udel.edu/
Location
Sharp Lab
Newark
19716
Contact Information
Services
Equipment
Electron Microscopy
JEOL JSM 6330F Field Emission Scanning Electron Microscope (SEM) ultra-high vacuum scanning electron microscope with cold field emission electron source enabling high resolution imaging. Fitted with IXRF Systems secondary electron detector and solid state backscattered detector for elemental analysis and mapping. Images stored digitally.
JEOL JEM 3010 Transmission Electron Microscope (TEM) ultrahigh resolution analytical electron microscope with a point to point and lattice resolution of 0.17nm and 0.14 nm, respectively. Features include a micro active goniometer with motorized axes and computer controlled data management and storage. This instrument is particularly useful for high resolution imaging, electron diffraction and spatially resolved composition analysis.
X-Ray Diffraction
The Rigaku IV X-ray Diffractometer is a high precision powder X-ray diffractometer with horizontal sample mount. Users can use the system as a dedicated focusing-beam system for general powder and bulk samples or switch between the Crossbeam optics for multi-layer film parallel beam, small angle scattering, micro-focus, thin film high resolution, and in-plane X-ray optics. The tool uses a stepping motor with minimum step angles of 1/10000 degrees control.
Physical Property Measurement System
Quantum Design’s Physical Property Measurement System (PPMS) performs magnetic, electro-transport, and heat capacity measurements in sample environments having magnetic fields up to +-9 Tesla and temperatures ranging from 2 to 340 K. This PPMS is configured with the following measurements options: DC extraction magnetization, AC susceptibility, torque magnetometry, dc and ac resistivity, Hall effect, and heat capacity. A horizontal rotator is also available to perform angular studies of a sample’s magnetoresistance. A variety of platforms are available for mounting samples. Additional information and specifications can be found on the vendor’s webpage: http://www.qdusa.com/products/ppms.html
